Tai Site three-phase coupling decoupling network SGN3483T

SGN3483T coupling decoupling network is mainly to meet the combination wave surge tests for isolation surge signal, if the ordinary 3-phase power network will result in a voltage wave tail decay too fast, can not meet the standards. The performance of the network in line with GB / T3483 standards, can be used for coupling voltage wave 4 / 300μs, 10 / 200μs waveforms such decoupling test, with stable performance, with a load capacity and other characteristics. This set of network is suitable for SG-5020G surge test platform for the surge generator output surge, the surge signal to avoid damage to the power supply terminal of other devices. Standard IEC 61000-4-5, IEC61010-1, IEC61643, EN61000-4-5, GB / T3483, GN / T17626.5 advantage 1. Maximum decoupling pulse voltage 20kV 2. highest decoupling may impact current 10kA 3. Nagao prey strike wave voltage decoupling 4. Maximum decoupling pulse width 300μs 5. decoupling lightning surge waveforms: voltage wave 4 / 300μs voltage wave 10 / 200μs combination wave 1.2 / 50μs, 8 / 20μs lightning wave parameters Technical parameters Chung test common mode coupling 9uF (+ 10Ω) differential mode coupling 18uF injection surge <20kV injection inrush current <10kA (8 / 20μs) surge current coupling unit test injection discharge gap coupled 1kV-20kV surge voltage surge injection Current <20kA (8 / 20μs) 20mH decoupling inductor network load power three-phase five-wire AC380V 50Hz, 16A maximum load current DC220V DC power supply switching mode manual switching coupling manually superimposed short term overload current 1.1 times the time ≤1 minute * Note: As a result of this network 20mH large inductance, when the load current is large, across the inductor may be there is a big pressure, need to improve the input power supply voltage to meet the general parameters of the chassis size 22U Instrument Weight about 150 Kg temperature range testing needs -20 ~ + 50 ℃ Humidity ≤90% Altitude less than 1000m comes standard host, manual, test reports, test line