BC-SD6 digital circuit experiment box

BC-SD6 digital circuit experiment box BC-SD6 SD6 digital circuit experiment box a digital circuit experiment box, SD6 digital circuit experiment box system consisting of 1, Power: AC Input: 220V ± 10%, 50Hz fixed DC output: a 5V / 2A, -5V / 0.5A, ± 12V / 0.5A; adjustable DC output: + 1.2V ~ + 12V (/0.5A), - 1.2V ~ -12V (/0.5A) 2, manual single-pulse circuit 2 groups: each group can simultaneously output both positive and negative pulses, pulse amplitude TTL level. 3, continuous pulse source: 0 ~ 1MHz. 4, fixed frequency pulse source 16, the output is TTL level: 1Hz, 2Hz, 10Hz, 100Hz, 200Hz, 300Hz, 400Hz, 500Hz, 700Hz, 800Hz, 1KHz, 10KHz, 100KHz, 250KHz, 500KHz, 1MHz; 5, the timing pulse generating circuit and stops the control circuit. It can produce four pulses, pulse period of the clock signal input of the same, followed by a difference between an input clock cycle four pulses. 6, six high-precision digital frequency meter, measuring range: 0-9.9999MHz, error <1Hz. 7, sixteen logic level input switch: You can enter low level '0', the high level "1" (positive logic). 8, sixteen logic level indicator: lights to indicate a high level '1' indicator is off a low level '0'. 9, digital display: four from the seven-segment LED digital tube display consisting of BCD code decoding circuit, and two seven-segment LED digital tube. For digital clock, calendar and other experiments display. 10, a speaker and a drive circuit. As a clock timekeeping, alarm and music sounding device. 11, BCD code switch two groups. Provide BCD input. 12, logic pen, red: high; green: low; Orange: High impedance; 13, a variable potentiometer 4, respectively resistance 1K, 50K, 100K, 680K. 14, open experimental area for expansion experiments, curriculum design use. (1) provides two 40-pin locking socket, 20 core locking socket 3, 16 locking socket 4-core, 14-core locking socket 4, can be inserted 8-core to 40 cores of various IC. (2) discrete components patch area, patch resistors, capacitors, regulator, diodes, transistors and other components to facilitate the expansion. Second, an experimental project, and test logic gates experiment 2, combinational logic circuit (half adder, a full adder and logic operation) Experiment 3, test flip-flop (a) RS, D, JK 4, flip Experiment (b) the three-state output trigger latch 5, and 6 in the timing circuit test, integration test counter and register 7, decoder and data selector experiment