Mitutoyo Mitutoyo surface roughness measuring instrument rough

Product Description Mitutoyo surface roughness measuring instrument characteristics: SV-3100 series products can be high-precision, high-level analysis, multi-function 3D surface roughness analysis, the fine profile measurements, as well as the original surface roughness measurements. 1, the automatic leveling table, use an external device such adjustment stage 3-axis, effectively enhance the operational performance of the product, but also realize the automatic measurement. 2, the installation of a professional data analysis software SURFPAK-SV Using this software, the resulting data from the shop floor and laboratory management for unified format. 3, the use of ceramics produced X-axis drive unit guide, because the ceramic has excellent anti-wear properties. It can work without lubricating oil. 4, in order to guarantee high-precision measurements in X-axis and Y-axis (optional) are built on high-resolution glass scale (X-axis resolution: 0.05μm, Y axis resolution: 1μm) due to the guarantee SV-3100 series of products with a high degree of reliability, especially for horizontal roughness parameters (S, Sm), resolution of the X-axis must reach a considerable level. 5, with a precision stylus. 6, with a variety of functions, such as the "straightness compensation" to ensure the accuracy of the X-axis linear; "roundness compensation" to ensure that the vertical movement of the stylus; and the "tip radius compensation" and so on. 7, styli and stylus guide head can be easily replaced. Optional styli and rail roughness measurement can be adapted to a variety of needs, such as small holes measuring, deep hole measurement. 8, in a variety of models, also provides easy-to-control box. Separate control box with the host, remote execution location, start / stop measuring, returns and other operations remotely. Drive Unit up / down position and movement of the X-axis can be manually fine-tuning. Technical parameters X-axis measuring range: 100mm 200mm or resolution: 0.05μm detection methods: linear encoder drive speed: 0 - 80mm / s measurement speed: 0.02 - 5mm / s direction of movement: backwards straightness: (0.05 + 1L / 1000) μm * (0.5μm / 200mm: measuring range of 200mm model) Inclination range: ± 45o Z2 axis (column) vertical movement: 300mm or 500mm, powered resolution: 1μm detection methods: ABSOLUTE linear encoder drive speed: 0 - 20mm / s Detector Range / Resolution: 800μm / 0.01μm, 80μm / 0.001μm, 8μm / 0.0001μm (when using the probe option, up to 2400μm) detection method: Trackless / rail measuring force: 4mN or 0.75mN (low force type) Stylus tip: Diamond, 90o / 5μmR (60o / 2μmR: low load type) conductivity probe radius of curvature: 40mm Detection: Differential Inductive performance parameters: