Spectrometer ROHS environmental testing equipment halogen test alloy analyzer
Spectrometer ROHS environmental testing equipment halogen test alloy analyzer
? Applications Halogen-free RoHS directive instruction screening test screening test screening test Toys Directive alloy metal coating thickness measurement configuration component analysis Features latest patented technology "Sample Free Split" test mode:????? Using the latest patented technology of optical structure The minimum irradiation spot diameter can reach 0.5mm, combined with accurate spot positioning system, which can be achieved on complex samples Free Split direct measurement requirements in line with China's national standard configuration sample mix measurement functions:? 4mmⅩ4mm spot square design, with 0.5mm spot with the use of the circuit board can implement complex samples "no split" area scan measurements; thus significantly saving measurement time, greatly improve the detection efficiency configure ON-Line real-time online technical support system (optional)?: Real-time user of difficult technical problems to resolve in the course, as well as operator training for users to configure complex filter 16 sections:? NDA200 type equipped with 16 sets of complex filters, is the industry's most complete configuration, the maximum number of ? configure one; 16 sets of filter configuration, which guarantees the high XRF analyzer samples tested for a variety of complex adaptive built-in standard curve: The instrument built to meet EU-RoHS and CHINA-RoHS product certification requirements curve base materials, user directly; and with the certification testing laboratory designated by the State consistent with an open technology platform operating curve: curve based on open technology platform for electronics manufacturers can build their own plant-specific materials? ? curve, XRF analyzer to ensure the reliability and accuracy of the analysis software operating system hierarchical management: software configuration of the instrument system operators, engineers operating functions menu levels, easy to plant and orderly management; operator menus simple and intuitive, Avoid false instrument important parameter modification; powerful engineer menu functions, various parameters set permissions instrument open to all users with the classic labyrinth radiation protection structure: with a classic labyrinth radiation protection structure, while maintaining the appearance operate the instrument? convenience, the complete elimination of low-energy scattering X-rays leak optional patented technology "influence weight coefficient method" multilayer coating thickness measurement functions:? satisfied gifted Technology created the "impact weight coefficient method" multilayer coating thickness measurement technology, significantly ? improve the accuracy of coating thickness measurement; maximum measurable coating amount of 9 floors; completely solve the conventional XRF thickness measurement methods can not solve the technical problems the plastic matrix coating thickness measurement design practical and beautiful: ergonomic instrument appearance designed to facilitate the measurement process operator comfort analysis method and system software configuration analysis:??? based on the Monte Carlo method to calculate the basic parameters of the theoretical model of empirical coefficient α coefficient method Software Functional Description:? RoHS directives, instructions, etc. Halogen-free environment Analysis of Pb, Hg, Cd, TCr, TBr, Cl and other elements in the Directive limit? variety of metal materials, inorganic non-metallic materials (excluding polymer materials) analysis of the material (S ~ U elements)? polymers sulfur content of organic material (S) ~ uranium (U) elemental analysis? independent analysis report customization and output print? save the results of the analysis, query and statistics? On-Line real-time online technical support and technical services? multilayer coatings thickness measurement function (optional) Main configuration? Si-PIN US electric refrigeration semiconductor detector? side window molybdenum (Mo) target tube? standard set of composite filter 16? configuration of Φ0.5mm, Φ1mm, Φ3mm, Φ4mm four ? kinds of collimator in line with China's national standard sample mixed side features built standard curve configuration On-line real-time online technical support and service platform has an open technology platform operating curve analysis software operating system level management product parameter name????: X-ray fluorescence spectrometer Model: NDA200 Input voltage: 220 ± 5V / 50Hz Power consumption: ≤500W ambient temperature: 15-30 ℃ Humidity: ≤80% (non-condensing) host shape (mm): L * W * H = 900 * 500 * 440 sample compartment (mm): L * W * H = 430 * 380 * 120 Weight: about 60 kg Technical indicators element types: the time between the periodic table of elements measuring sulfur (S) ~ uranium (U) : polymer materials, typical measurement time of 200 seconds for the copper base material, typical measurement time of 400 seconds and the detection limit index (LOD): polymeric materials: LOD (Pb) ≤5mg / Kg; LOD (Hg) ≤ 5mg / Kg; LOD (TCr) ≤5mg / Kg; LOD (TBr) ≤5mg / Kg; LOD (Cd) ≤5mg / Kg of copper base material: LOD (Pb) ≤50mg / Kg precision indicators to continuously measure standard deviation σ characterize seven times: for polymer (plastic) material: LOD (Pb) ≤15mg / Kg; LOD (Hg) ≤15mg / Kg; LOD (TCr) ≤15mg / Kg; LOD (TBr) ≤15mg / Kg; LOD (Cd) ≤7mg / Kg of copper base material: LOD (Pb) ≤50mg / Kg accuracy indicators to system deviation δ characterization of polymeric materials: δ (Pb) ≤100mg / Kg; δ (Hg ) ≤100mg / Kg; δ (TBr) ≤100mg / Kg; δ (TCr) ≤100mg / Kg; δ (Cd) ≤10mg / Kg of copper base material: δ (Pb) ≤150mg / Kg
Contact Detail
Company Name: | Jiang Messina gifted Technology Co., Ltd. |
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Employee Number: | |
Annual export: | |
Year Established: | |
Contact Person: | Mr. Gao Chang() |
Telephone Number: | 0755-33625251 |
Company Address: | Shenzhen, Shenzhen City, Guangdong, China |
Zip/Postal Code: |
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