Surface topography test

Surface morphology of micro promotion content: testing industry sample was observed with an optical microscope and general morphology electron microscope (SEM), which has the advantage of an optical microscope is simple, can be measured visually see position morphology, color and so on. In the field of macro-morphology, optical microscope (SEM) has irreplaceable advantages, but in the microscopic morphology, optical microscopy is due to the small depth of field and cause a lot of limitations. For example, sample observation plane need to be very smooth, otherwise the difference was not observed or taken out of the picture quality, then sample preparation samples need to grind, but it undermines the original surface morphology of the samples. This time we need electron microscope (SEM) to make up for this deficiency. Compared with traditional optical microscope, scanning electron microscopy (SEM) has the following characteristics: 1, can directly observe the structure of the sample surface, the sample size can be as large as 120mm × 80mm × 50mm. 2, sample preparation is simple, not sliced. 3, the sample can be used for translation and rotation of three-dimensional space in the sample chamber, and therefore, from a variety of angles samples were observed. 4, large depth of field, rich three-dimensional image. Scanning electron microscopy (SEM) than the depth of field of an optical microscope, hundreds of times larger. 5, wide zoom range image, the resolution is relatively high. Zoom ten times to several tens of times the image resolution of up to 3nm. 6, the electron beam to a lesser extent of damage and contamination of the sample. 7, while observing the morphology, but also the use of other signals for microanalysis emitted from the sample analysis. Scanning electron microscope (SEM) is the most powerful tool to observe morphology, it has been widely used in materials, biotechnology, environment. In the first two cases.