Surface morphology and composition analysis / foreign body analysis / SEM / EDS test

Surface morphology and composition analysis to characterize materials by surface analysis of samples and / or near the surface. Based on the information you need, we can choose the best analytical technique for your project. Most of our technology uses solid samples, sometimes less liquid sample to obtain chemical information about the solid surface. In many cases, materials characterization and surface analysis is a good choice, the vast majority belong to two categories: 1) known what kind of material they own, but want more information on specific properties, such as interface sharpness, profile distribution, morphology, crystal structure, thickness, stress, and quality. 2) You have to not fully understand the material, want to find out about its ingredients, contaminants, residues, interface layer and impurities. Surface morphology and composition analysis to characterize materials by surface analysis of samples and / or near the surface. Based on the information you need, we can choose the best analytical technique for your project. Most of our technology uses solid samples, sometimes less liquid sample to obtain chemical information about the solid surface. In many cases, materials characterization and surface analysis is a good choice, the vast majority belong to two categories: 1) known what kind of material they own, but want more information on specific properties, such as interface sharpness, profile distribution, morphology, crystal structure, thickness, stress, and quality. 2) You have to not fully understand the material, want to find out about its ingredients, contaminants, residues, interface layer and impurities. Main features: 1. Sample preparation is simple, short test period; 2. Depth of field, and have a strong three-dimensional, suitable for observation as a rough surface like fracture; 3. Qualitative material surface can be organized, semi-quantitative analysis; 4. Both to ensure a high-resolution high-voltage, but also provides high-quality images at a low voltage; technical parameters: Resolution: High mode: 3nm, low-voltage mode: 4nm Magnification: 5-100 times the detection element: Be4-PU94 The maximum sample diameter: 200mm image mode: secondary electrons, backscattered